Yahoo Finance

Toshiba Starts Test-Sample Shipments of a Bare Die 1200V SiC MOSFET with Low On-Resistance and High Reliability, for Use in Automotive Traction Inverters

KAWASAKI, Japan, November 12, 2024--(BUSINESS WIRE)--Toshiba Electronic Devices & Storage Corporation ("Toshiba") has developed "X5M007E120," a bare die [1] 1200V silicon carbide (SiC) MOSFET for ...
Nature

Adaptive Testing in Integrated Circuits Using Machine Learning

Adaptive testing in integrated circuits (ICs) has emerged as an innovative strategy to optimise and streamline the evaluation of increasingly complex semiconductor devices. By incorporating machine ...
Nature

At-Speed Testing and Delay Defect Analysis in Integrated Circuits

At-speed testing and delay defect analysis have become increasingly critical in ensuring the reliability and performance of modern integrated circuits. As circuit complexity grows alongside rapid ...
The Mirror

F1 testing halted on first day as huge power failure hits Bahrain circuit

A circuit-wide power failure saw Formula 1 pre-season testing halted for more than an hour on the first day. Day one of the three-day test at the Bahrain International Circuit was running smoothly ...